SeetheUnseenSliceBySlice

A Cutting Edge Approach to Volume Electron Microscopy

3D Microscopy Sample

AMicrotomethatTransformsAnySEMtoaVolumeSEM

We design, develop and manufacture the revolutionising serial block-face imaging tool — the katana microtome

Universal compatibility

Seamlessly integrates with any SEM that has a stage-to-pole piece distance greater than 56 mm. That is 99% of all contemporary FEG SEMs. Official integration with TESCAN and JEOL SEMs.

Plug and play

A simple installation process that takes mere minutes, swiftly preparing your SEM for volume EM imaging.

Precision and stability

Engineered to achieve maximum stiffness alongside nanometre resolution, reliable for extensive imaging periods.

Trusted by Leading Research Institutions

University of Lausanne
University of Cambridge
Washington University
University of Innsbruck
National University of Singapore
University of Sydney
La Trobe University
King's College London
CNPEM

Now available with Precision Charge Neutralisation

Eliminates charging artifacts by delivering a highly targeted ionised gas

Without charge neutralisation — visible charging artifacts
With charge neutralisation — clean, artifact-free imaging
Without PCN
With PCN

Introducing

The Kensho BSED

See the true nature of things.

Ultra-sensitive detection · Optimised for low dose · Low kV imaging

Kensho BSED — Backscattered Electron Detector
Find Out More